Yes, tungsten needles can be used for atomic force microscopy (AFM) applications. In AFM, a sharp tip is used to scan the surface of a sample to create a high-resolution image. Tungsten needles are often used as the tip for AFM probes due to their high strength, stiffness, and small tip radius. The tip radius can be sharpened to a few nanometers, allowing for precise imaging at the nanoscale. Tungsten needles can also be coated with materials such as diamond-like carbon to improve their durability and reduce wear during scanning.
