A semiconductor probe station is a device used for semiconductor device testing and analysis that includes a table with probes mounted on it to make electrical measurements. These devices are typically designed to test the electrical properties of semiconductor chips, devices, or other semiconductor materials at the microscopic scale.
The following are some general features and functions of semiconductor probe stations:
1. Probe installation: A set of tiny probes are usually installed on a semiconductor probe station. These probes are used to make electrical connections with different parts of the semiconductor device for electrical measurements.
2. Fine-tuning capability: Since the testing of semiconductor devices usually requires a high degree of accuracy, semiconductor probe stations usually have fine-tuning controls to ensure accurate detection and measurement.
3. Multi-channel configuration: Some semiconductor probe stations may have multiple channels, allowing them to test multiple points at the same time and improve testing efficiency.
4. Automation: Some advanced semiconductor probe stations have automation functions that can automatically perform a series of test steps to improve test efficiency and consistency.
5. Temperature control function: In some applications, the performance of semiconductor devices may be affected by temperature, so some probe stations may have temperature control functions to conduct testing at different temperatures.
This kind of equipment is widely used in the semiconductor industry to study and test the electrical properties, material properties, etc. of new semiconductor devices. In the field of semiconductor manufacturing and R&D, the semiconductor probe station is one of the indispensable tools.
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