The semiconductor tungsten probe station may refer to a device used for testing semiconductor devices, which contains a tungsten probe and is equipped with a table for supporting and positioning the semiconductor device to be tested.
Here are some possible features and functions:
1. Probe: The semiconductor tungsten needle probe station is equipped with tiny probes made of tungsten. These probes are used to establish electrical connections with different parts of the semiconductor device for electrical measurements.
2. Fine-tuning capability: In order to ensure accurate detection and measurement, semiconductor tungsten needle probe stations usually have fine-tuning controls, allowing users to accurately position the probe.
3. Multi-channel configuration: Some semiconductor tungsten needle probe stations may have multiple channels, allowing multiple points to be tested at the same time to improve testing efficiency.
4. Automation: Advanced equipment may have automation functions that can automatically perform a series of test steps to improve the efficiency and consistency of testing.
5. Temperature control function: In semiconductor device testing, the impact of temperature on performance is an important consideration. Therefore, some equipment may have temperature control capabilities, allowing testing at different temperatures.
Such semiconductor tungsten probe stations are used for electrical testing and analysis of semiconductor devices in laboratory and semiconductor manufacturing environments. These tests can include measurements of current-voltage characteristics, extraction of device parameters, and evaluation of device performance under different conditions.
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