Wafer tungsten probe card is a device used for wafer testing. It usually consists of a test circuit board and a tungsten probe. The function of the tungsten probe card is to test the electrical properties of the wafer by contacting the tungsten probe with the wafer surface. This testing method can effectively detect the quality and performance of wafers and is an indispensable link in the semiconductor manufacturing process.
1. Probe Card for Semiconductor Testing: A wafer tungsten probe card may be a device used for testing semiconductor wafers. In the semiconductor industry, wafers are the basis for semiconductor device manufacturing, and probe cards may be used to connect to the wafers to test the performance and electrical characteristics of the devices.
2. Application of tungsten probes in probe cards: This may mean that the probes used in the probe cards are made of tungsten. Tungsten has high hardness and high melting point, which enables it to work stably in high temperature environments and is suitable for some special testing conditions.
3. Probe cards specially designed for wafer testing: Wafer testing may involve testing multiple devices on the wafer, which requires specially designed probe cards to ensure efficient and accurate testing of the entire wafer.
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