Wafer tungsten probe card is a special equipment used for semiconductor wafer testing. It consists of a test circuit board and a tungsten probe. It is mainly used to test the electrical properties of the wafer.
The design principle of the wafer tungsten probe card is to directly contact the tip of the tungsten probe with the pad of the wafer under test, and transmit the test signal to the tungsten probe through the test circuit board, thereby realizing the electrical performance test of the wafer.
The application fields of wafer tungsten probe cards include wafer testing in semiconductor manufacturing. By using wafer tungsten probe cards for testing, accurate test data and reliable test results can be obtained, providing important information for quality control and optimization of semiconductor manufacturing. technical support.
When using wafer tungsten probe cards for wafer testing, you need to pay attention to correct installation, careful operation, regular inspection, cleaning and maintenance, and safety protection.
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