The tungsten probe card is a tool used for wafer testing. It usually consists of a test circuit board and a tapered tungsten needle with a needle tip bent into 95-105 degrees on the circuit board. During testing, the needle of the tungsten probe is directly contacted with the pad of the wafer under test to test the electrical properties of the wafer.
In context, the term “tungsten probe card” does not have a specific definition and may be a term that appears in a specific field or industry. Generally speaking, tungsten is a metallic element, and probe cards are typically devices used for testing, measurement, or diagnostics. Below I offer some possible explanations:
1. The application of tungsten probes in probe cards: It may refer to the use of tungsten material as the probe material when manufacturing probe cards. Tungsten has a high melting point and hardness, which makes it advantageous in some testing environments with special requirements.
2. Special purpose probe card: The tungsten probe card may also be a probe card specially designed for some special applications, such as testing in high temperature environments, which require high wear resistance and stability of the probe.
3. Specific industry terminology: In some specific industries or fields, “tungsten probe card” may be a proper noun, and you need to consult literature or information in related fields to obtain the specific meaning.
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