Gold-plated tungsten carbide probe is a special probe, which is made of tungsten carbide and coated with a gold film on the surface. This type of probe is typically used in high-precision and high-reliability test environments, such as semiconductor manufacturing and inspection.
Tungsten carbide is a material with high hardness, high wear resistance and high corrosion resistance, so the probe made of it has a long service life and high stability. The gold plating layer can enhance the conductivity and corrosion resistance of the probe, giving it better stability and reliability during testing.
Gold-coated tungsten carbide probes are commonly used in high-precision testing environments, such as wafer testing in semiconductor manufacturing. During the test process, the needle of the gold-plated tungsten carbide probe needs to be in contact with the pad of the wafer under test to test the electrical properties of the wafer. Because the tungsten carbide probe has high hardness and high wear resistance, the stability and accuracy of the test can be guaranteed. At the same time, the gold plating layer can enhance the conductivity and corrosion resistance of the probe, giving it better stability and reliability during testing.
In short, the gold-plated tungsten carbide probe is a high-precision and high-reliability probe, which is commonly used in testing environments in fields such as semiconductor manufacturing and inspection. Due to its high hardness and high wear resistance, the stability and accuracy of the test can be guaranteed. At the same time, the gold plating layer can enhance the conductivity and corrosion resistance of the probe, giving it better stability and reliability during testing.
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