A tungsten probe is a tool used for chip testing. It usually consists of a test circuit board and a tungsten probe. The function of the spot tungsten probe is to test the electrical properties of the chip by contacting the tungsten probe with a specific point on the surface of the chip. This testing method can effectively detect the quality and performance of chips and is an indispensable link in the semiconductor manufacturing process. Unlike wafer tungsten probe cards, spot tungsten probes are usually used to test a single chip, while wafer tungsten probe cards are used to test the entire wafer.
A tungsten probe may refer to a tungsten probe used for measurement or inspection, especially at the micro or nanoscale. Here are possible explanations:
1. Tungsten Probe in Atomic Force Microscope (AFM): In nanoscale instruments such as AFM, the probe is the tip part used to sense the surface. Tungsten probe may refer to a class of these probes made using tungsten material for surface topology measurements at the nanometer scale.
2. Tungsten Probes in Electron Microscopy (SEM): In electron microscopy, probes are also used for high-resolution imaging. Tungsten probes may be used in instruments such as SEM to obtain high-resolution surface topography information.
3. Spot tungsten needles in the field of test and measurement: In some test and measurement applications, spot tungsten needles may be used to conduct electrical performance tests at the microscopic level, such as measuring resistance, current, etc. on electronic devices or semiconductor devices. parameter.
Overall, the exact meaning of a tungsten spot probe depends on the context and area of use. If there is a specific context or application scenario, more information can be provided to provide a more accurate explanation.
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