Tungsten probe cards are widely used in wafer testing in the field of semiconductor manufacturing. During the semiconductor manufacturing process, the electrical performance and reliability of the chips or devices on the wafer need to be tested to ensure the quality and performance of the product. By using tungsten probe cards for testing, accurate test data and reliable test results can be obtained, providing important technical support for quality control and optimization of semiconductor manufacturing.
More details of tungsten needles, please visit website: http://tungsten.com.cn/tungsten-needles-and-pins.html
Please contact CHINATUNGSTEN for inquiry and order of tungsten needles:
Email: sales@chinatungsten.com
Tel.: +86 592 5129595
