A coaxial probe is a measurement device commonly used in electronic test equipment to measure radio frequency (RF) signals from electronic circuits in silicon wafers, dies, and open microchips. Additionally, coaxial probes are used in narrow pitch or high-density RF interconnect applications in connector assemblies. The tip of this probe is very small and can be in close contact with the surface of the device under test to obtain accurate signals. The structure and design of the coaxial probe enable it to have high accuracy, high stability and high reliability, allowing measurements to be made under harsh environmental conditions. In the radio frequency field, coaxial probes are one of the most important measurement tools and are widely used in scientific research and technology development.
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