A tungsten probing tip is a probe designed to test multiple test points simultaneously. These probes have multiple independent channels, allowing them to make electrical connections to multiple test points in a single test. This design helps improve test efficiency, especially when multiple circuit components or multiple chips need to be tested simultaneously.
Some features and application areas include:
1. Efficient testing: Tungsten probing tip can establish electrical connections with multiple test points simultaneously in a single test, thereby improving testing efficiency.
2. Multi-chip testing: In integrated circuit manufacturing, multi-channel probes can be used to test multiple chips or multiple circuit components at the same time to ensure production efficiency.
3. High-density testing: These probes are suitable for high-density test layouts where the distance between test points is small.
4. Reduce test time: By testing multiple test points simultaneously, multi-channel probes can significantly reduce overall test time.
5. Production line application: In semiconductor production lines, probes of this design can help improve the testing speed and efficiency of mass production.
6. Automated testing: Tungsten probing tips are adapted to automated testing systems and can work together with equipment such as automatic robotic arms or robots to achieve a highly automated testing process.
More details of tungsten probes, please visit website: http://tungsten.com.cn/tungsten-needles-and-pins.html
Please contact CHINATUNGSTEN for inquiry and order of tungsten needles:
Email: sales@chinatungsten.com
Tel.: +86 592 5129595
