Tungsten wire probes have many uses in electron microscope testing, mainly including the following aspects:
1. Electron source: As one of the electron sources, tungsten wire probes can generate high-energy electron beams to scan the sample surface, thereby stimulating various physical and chemical information of the sample. This information includes morphology, composition, crystal structure, etc.
2. Heater: In some electron microscope tests, it is necessary to heat the sample to change its physical and chemical properties. At this time, the tungsten wire probe can be used as a heater to heat the sample surface through electric current to achieve heating and property change of the sample.
3. Lead material: In electron microscope testing, it is necessary to introduce current into the sample surface for testing. As a lead material, tungsten wire probes can introduce current from the test instrument to the sample surface to achieve current transmission and control.
4. Engraving tool: Tungsten wire probes can also be used for engraving metal surfaces, cutting particles in collodion, and operating single particles. Because these needles are very brittle, they are often bent or broken. Hand operation is required to complete particle cutting. These tungsten needles are not only used for particle cutting, but also for crystal embryos and glass blowing.
More details of tungsten probes, please visit website: http://tungsten.com.cn/tungsten-needles-and-pins.html
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