The tungsten-rhenium contact probe is a high-precision probe used in test and measurement systems. It is mainly made of tungsten alloy material and has the characteristics of high hardness, high wear resistance and high corrosion resistance. It is usually used to connect the test instrument and the circuit under test to realize the transmission and control of electrical signals. The tungsten-rhenium contact probe plays an important role in semiconductor testing, wafer testing, PCB testing and other fields, and is an indispensable part of modern electronic manufacturing and testing.
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